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dc.contributor.authorLu, Yufan
dc.contributor.authorChen, Xin
dc.contributor.authorZhai, Xiaojun
dc.contributor.authorSaha, Sangeet
dc.contributor.authorEhsan, Shoaib
dc.contributor.authorSu, Jinya
dc.contributor.authorMcDonald-Maier, Klaus
dc.date.accessioned2022-04-25T11:36:01Z
dc.date.available2022-04-25T11:36:01Z
dc.date.issued2021-05-01
dc.identifier.citationLu , Y , Chen , X , Zhai , X , Saha , S , Ehsan , S , Su , J & McDonald-Maier , K 2021 , ' A fast simulation method for analysis of SEE in VLSI ' , Microelectronics reliability , vol. 120 , 114110 . https://doi.org/10.1016/j.microrel.2021.114110en
dc.identifier.issn0026-2714
dc.identifier.otherPURE: 215299673
dc.identifier.otherPURE UUID: fd972bc9-7ddb-491e-8567-31c3c54187af
dc.identifier.otherWOS: 000663147500007
dc.identifier.otherScopus: 85103379782
dc.identifier.otherORCID: /0000-0002-3121-7208/work/112496145
dc.identifier.urihttps://hdl.handle.net/2164/18477
dc.descriptionThis work is supported by the UK Engineering and Physical Sciences Research Council through grants EP/R02572X/1 and EP/P017487/1.en
dc.format.extent12
dc.language.isoeng
dc.relation.ispartofMicroelectronics reliabilityen
dc.rightsThis is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).en
dc.subjectSingle event effecten
dc.subjectFault injectionen
dc.subjectSEE modelsen
dc.subjectSEE mitigationen
dc.subjectHDL simulationen
dc.subjectVLSIen
dc.subjectEVENTen
dc.subjectPROPAGATIONen
dc.subjectQA75 Electronic computers. Computer scienceen
dc.subjectEngineering and Physical Sciences Research Council (EPSRC)en
dc.subjectEP/R02572X/1en
dc.subjectEP/P017487/1en
dc.subject.lccQA75en
dc.titleA fast simulation method for analysis of SEE in VLSIen
dc.typeJournal articleen
dc.contributor.institutionUniversity of Aberdeen.Computing Scienceen
dc.contributor.institutionUniversity of Aberdeen.Machine Learningen
dc.description.statusPeer revieweden
dc.description.versionPublisher PDFen
dc.identifier.doihttps://doi.org/10.1016/j.microrel.2021.114110


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