| dc.contributor.author | Lu, Yufan | |
| dc.contributor.author | Chen, Xin | |
| dc.contributor.author | Zhai, Xiaojun | |
| dc.contributor.author | Saha, Sangeet | |
| dc.contributor.author | Ehsan, Shoaib | |
| dc.contributor.author | Su, Jinya | |
| dc.contributor.author | McDonald-Maier, Klaus | |
| dc.date.accessioned | 2022-04-25T11:36:01Z | |
| dc.date.available | 2022-04-25T11:36:01Z | |
| dc.date.issued | 2021-05-01 | |
| dc.identifier.citation | Lu , Y , Chen , X , Zhai , X , Saha , S , Ehsan , S , Su , J & McDonald-Maier , K 2021 , ' A fast simulation method for analysis of SEE in VLSI ' , Microelectronics reliability , vol. 120 , 114110 . https://doi.org/10.1016/j.microrel.2021.114110 | en |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.other | PURE: 215299673 | |
| dc.identifier.other | PURE UUID: fd972bc9-7ddb-491e-8567-31c3c54187af | |
| dc.identifier.other | WOS: 000663147500007 | |
| dc.identifier.other | Scopus: 85103379782 | |
| dc.identifier.other | ORCID: /0000-0002-3121-7208/work/112496145 | |
| dc.identifier.uri | https://hdl.handle.net/2164/18477 | |
| dc.description | This work is supported by the UK Engineering and Physical Sciences Research Council through grants EP/R02572X/1 and EP/P017487/1. | en |
| dc.format.extent | 12 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Microelectronics reliability | en |
| dc.rights | This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). | en |
| dc.subject | Single event effect | en |
| dc.subject | Fault injection | en |
| dc.subject | SEE models | en |
| dc.subject | SEE mitigation | en |
| dc.subject | HDL simulation | en |
| dc.subject | VLSI | en |
| dc.subject | EVENT | en |
| dc.subject | PROPAGATION | en |
| dc.subject | QA75 Electronic computers. Computer science | en |
| dc.subject | Engineering and Physical Sciences Research Council (EPSRC) | en |
| dc.subject | EP/R02572X/1 | en |
| dc.subject | EP/P017487/1 | en |
| dc.subject.lcc | QA75 | en |
| dc.title | A fast simulation method for analysis of SEE in VLSI | en |
| dc.type | Journal article | en |
| dc.contributor.institution | University of Aberdeen.Computing Science | en |
| dc.contributor.institution | University of Aberdeen.Machine Learning | en |
| dc.description.status | Peer reviewed | en |
| dc.description.version | Publisher PDF | en |
| dc.identifier.doi | https://doi.org/10.1016/j.microrel.2021.114110 | |
| dc.identifier.vol | 120 | en |
