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dc.contributor.authorRout, Nibedita
dc.contributor.authorBaciu, George
dc.contributor.authorPattanaik, Priyabrata
dc.contributor.authorNakkeeran, K.
dc.contributor.authorKhandual, Asimananda
dc.date.accessioned2022-11-24T16:26:01Z
dc.date.available2022-11-24T16:26:01Z
dc.date.issued2022-11-24
dc.identifier.citationRout , N , Baciu , G , Pattanaik , P , Nakkeeran , K & Khandual , A 2022 , ' Color and Texture Analysis of Textiles Using Image Acquisition and Spectral Analysis in Calibrated Sphere Imaging System-I ' , Electronics (Switzerland) , vol. 11 , no. 23 , 3887 . https://doi.org/10.3390/electronics11233887en
dc.identifier.issn2079-9292
dc.identifier.otherPURE: 222473951
dc.identifier.otherPURE UUID: 1bfee0ce-fd29-4b69-a186-70a00623d681
dc.identifier.otherRIS: urn:2A53C433BA387935DD5FEF9875A22FCE
dc.identifier.otherORCID: /0000-0001-6083-9973/work/123848095
dc.identifier.urihttps://hdl.handle.net/2164/19601
dc.descriptionFunding This research received no external funding. Acknowledgments We are also grateful to Manas Sarkar, ITC, HKPU for providing cotton samples with varied textures and Dystar, Hong Kong, for generously providing us with dye samples. We are thankful to for the experimental support from new fiber science and IoT Lab, OUTR sponsored by TEQIP-3 seed money and MODROB (/9-34/RIFDMO DPOLICY-1/2018-19).en
dc.format.extent14
dc.language.isoeng
dc.relation.ispartofElectronics (Switzerland)en
dc.rightsCopyright: © 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/ 4.0/).en
dc.subjectcomputer visionen
dc.subjectCIE color spaceen
dc.subjectcolor image processingen
dc.subjectradianceen
dc.subjecttri-stimulus valueen
dc.subjectd/80 geometryen
dc.subjectintegrating sphere imagingen
dc.subjectTA Engineering (General). Civil engineering (General)en
dc.subject.lccTAen
dc.titleColor and Texture Analysis of Textiles Using Image Acquisition and Spectral Analysis in Calibrated Sphere Imaging System-Ien
dc.typeJournal articleen
dc.contributor.institutionUniversity of Aberdeen.Engineeringen
dc.description.statusPeer revieweden
dc.description.versionPublisher PDFen
dc.identifier.doihttps://doi.org/10.3390/electronics11233887
dc.identifier.vol11en
dc.identifier.iss23en


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