Wheat Stripe Rust Grading by Deep Learning With Attention Mechanism and Images From Mobile Devices
Publication date
09/09/2020Metadata
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Mi , Z , Zhang , X , Su , J , Han , D & Su , B 2020 , ' Wheat Stripe Rust Grading by Deep Learning With Attention Mechanism and Images From Mobile Devices ' , Frontiers in plant science , vol. 11 , 558126 . https://doi.org/10.3389/fpls.2020.558126
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Copyright © 2020 Mi, Zhang, Su, Han and Su. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms. https://creativecommons.org/licenses/by/4.0/