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Wheat Stripe Rust Grading by Deep Learning With Attention Mechanism and Images From Mobile Devices

dc.contributor.authorMi, Zhiwen
dc.contributor.authorZhang, Xudong
dc.contributor.authorSu, Jinya
dc.contributor.authorHan, Dejun
dc.contributor.authorSu, Baofeng
dc.date.accessioned2023-03-08T16:54:01Z
dc.date.available2023-03-08T16:54:01Z
dc.date.issued2020-09-09
dc.identifier.citationMi , Z , Zhang , X , Su , J , Han , D & Su , B 2020 , ' Wheat Stripe Rust Grading by Deep Learning With Attention Mechanism and Images From Mobile Devices ' , Frontiers in plant science , vol. 11 , 558126 . https://doi.org/10.3389/fpls.2020.558126en
dc.identifier.issn1664-462X
dc.identifier.otherPURE: 215299995
dc.identifier.otherPURE UUID: 5f4fe05a-57e1-4fb4-9dd2-cffcdcbfbce3
dc.identifier.otherScopus: 85091438554
dc.identifier.urihttps://hdl.handle.net/2164/20260
dc.descriptionAuthor Contributions ZM designed and performed the experiment, selected algorithm, analyzed data, and wrote the manuscript. XZ trained algorithms and analyzed data. JS analyzed data and wrote the manuscript. DH collected data and monitored data analysis. BS conceived the study and participated in its design. All authors contributed to the article and approved the submitted version. Funding This work was funded by the Fundamental Research Funds for the Central Universities (No.2452019028).en
dc.language.isoeng
dc.relation.ispartofFrontiers in plant scienceen
dc.rightsCopyright © 2020 Mi, Zhang, Su, Han and Su. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms. https://creativecommons.org/licenses/by/4.0/en
dc.subjectSDG 3 - Good Health and Well-beingen
dc.subjectattention mechanismen
dc.subjectC-DenseNeten
dc.subjectCBAM moduleen
dc.subjectdisease gradingen
dc.subjectwheat stripe rusten
dc.subjectQ Scienceen
dc.subjectPlant Scienceen
dc.subjectSupplementary Dataen
dc.subject.lccQen
dc.titleWheat Stripe Rust Grading by Deep Learning With Attention Mechanism and Images From Mobile Devicesen
dc.typeJournal articleen
dc.contributor.institutionUniversity of Aberdeen.Computing Scienceen
dc.contributor.institutionUniversity of Aberdeen.Machine Learningen
dc.description.statusPeer revieweden
dc.description.versionPublisher PDFen
dc.identifier.doihttps://doi.org/10.3389/fpls.2020.558126
dc.identifier.urlhttp://www.scopus.com/inward/record.url?scp=85091438554&partnerID=8YFLogxKen
dc.identifier.vol11en


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