T2FNorm : Train-time Feature Normalization for OOD Detection in Image Classification
| dc.contributor.author | Regmi, Sudarshan | |
| dc.contributor.author | Panthi, Bibek | |
| dc.contributor.author | Dotel, Sakar | |
| dc.contributor.author | Gyawali, Prashnna K | |
| dc.contributor.author | Stoyanov, Danail | |
| dc.contributor.author | Bhattarai, Binod | |
| dc.contributor.institution | University of Aberdeen.Computing Science | en | 
| dc.date.accessioned | 2024-10-07T10:39:01Z | |
| dc.date.available | 2024-10-07T10:39:01Z | |
| dc.date.issued | 2024-09-27 | |
| dc.format.extent | 10 | |
| dc.format.extent | 5743457 | |
| dc.identifier | 291901756 | |
| dc.identifier | 60707cb9-faa1-471f-9f3d-f31a4a4513d7 | |
| dc.identifier | 85206439062 | |
| dc.identifier.citation | Regmi, S, Panthi, B, Dotel, S, Gyawali, P K, Stoyanov, D & Bhattarai, B 2024, T2FNorm : Train-time Feature Normalization for OOD Detection in Image Classification. in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops. IEEE Explore, pp. 153-162, The IEEE/CVF Conference on Computer Vision and Pattern Recognition 2024, Seattle, Washington, United States, 17/06/24. https://doi.org/10.1109/CVPRW63382.2024.00020 | en | 
| dc.identifier.citation | conference | en | 
| dc.identifier.doi | 10.1109/CVPRW63382.2024.00020 | |
| dc.identifier.isbn | 979-8-3503-6548-1 | |
| dc.identifier.isbn | 979-8-3503-6547-4 | |
| dc.identifier.other | Bibtex: Regmi_2024_CVPR | |
| dc.identifier.other | ORCID: /0000-0001-7171-6469/work/169079146 | |
| dc.identifier.uri | https://hdl.handle.net/2164/24347 | |
| dc.identifier.url | http://www.scopus.com/inward/record.url?scp=85206439062&partnerID=8YFLogxK | en | 
| dc.identifier.url | https://openaccess.thecvf.com/content/CVPR2024W/TCV2024/html/Regmi_T2FNorm_Train-time_Feature_Normalization_for_OOD_Detection_in_Image_Classification_CVPRW_2024_paper.html | en | 
| dc.identifier.url | https://openaccess.thecvf.com/content/CVPR2024W/TCV2024/papers/Regmi_T2FNorm_Train-time_Feature_Normalization_for_OOD_Detection_in_Image_Classification_CVPRW_2024_paper.pdf | en | 
| dc.language.iso | eng | |
| dc.publisher | IEEE Explore | |
| dc.relation.ispartof | Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops | en | 
| dc.subject | QA75 Electronic computers. Computer science | en | 
| dc.subject.lcc | QA75 | en | 
| dc.title | T2FNorm : Train-time Feature Normalization for OOD Detection in Image Classification | en | 
| dc.type | Conference item | en | 
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