A fast simulation method for analysis of SEE in VLSI

Lu, YufanChen, XinZhai, XiaojunSaha, SangeetEhsan, ShoaibSu, JinyaMcDonald-Maier, Klaus2022-04-252022-04-252021-05-01Lu, Y, Chen, X, Zhai, X, Saha, S, Ehsan, S, Su, J & McDonald-Maier, K 2021, 'A fast simulation method for analysis of SEE in VLSI', Microelectronics reliability, vol. 120, 114110. https://doi.org/10.1016/j.microrel.2021.1141100026-2714ORCID: /0000-0002-3121-7208/work/112496145https://hdl.handle.net/2164/18477This work is supported by the UK Engineering and Physical Sciences Research Council through grants EP/R02572X/1 and EP/P017487/1.123021834engSingle event effectFault injectionSEE modelsSEE mitigationHDL simulationVLSIEVENTPROPAGATIONQA75 Electronic computers. Computer scienceEngineering and Physical Sciences Research Council (EPSRC)EP/R02572X/1EP/P017487/1QA75A fast simulation method for analysis of SEE in VLSIJournal article10.1016/j.microrel.2021.114110120