T2FNorm : Train-time Feature Normalization for OOD Detection in Image Classification

Regmi, SudarshanPanthi, BibekDotel, SakarGyawali, Prashnna KStoyanov, DanailBhattarai, Binod2024-10-072024-10-072024-09-27Regmi, S, Panthi, B, Dotel, S, Gyawali, P K, Stoyanov, D & Bhattarai, B 2024, T2FNorm : Train-time Feature Normalization for OOD Detection in Image Classification. in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops. IEEE Explore, pp. 153-162, The IEEE/CVF Conference on Computer Vision and Pattern Recognition 2024, Seattle, Washington, United States, 17/06/24. https://doi.org/10.1109/CVPRW63382.2024.00020conference979-8-3503-6548-1979-8-3503-6547-4Bibtex: Regmi_2024_CVPRORCID: /0000-0001-7171-6469/work/169079146https://hdl.handle.net/2164/24347105743457engQA75 Electronic computers. Computer scienceQA75T2FNorm : Train-time Feature Normalization for OOD Detection in Image ClassificationConference item10.1109/CVPRW63382.2024.00020http://www.scopus.com/inward/record.url?scp=85206439062&partnerID=8YFLogxKhttps://openaccess.thecvf.com/content/CVPR2024W/TCV2024/html/Regmi_T2FNorm_Train-time_Feature_Normalization_for_OOD_Detection_in_Image_Classification_CVPRW_2024_paper.htmlhttps://openaccess.thecvf.com/content/CVPR2024W/TCV2024/papers/Regmi_T2FNorm_Train-time_Feature_Normalization_for_OOD_Detection_in_Image_Classification_CVPRW_2024_paper.pdf