Cai, ShuoLuo, TingyuYu, FeiSharma, Pradip KumarWang, WeizhengYin, Lairong2023-11-012023-11-012023-10-08Cai, S, Luo, T, Yu, F, Sharma, P K, Wang, W & Yin, L 2023, 'Reliability Analysis of Correlated Competitive and Dependent Components Considering Random Isolation Times', Computers, Materials and Continua, vol. 76, no. 3, pp. 2763-2777. https://doi.org/10.32604/cmc.2023.0378251546-2218ORCID: /0000-0001-6620-9083/work/146067764https://hdl.handle.net/2164/22087Funding Information: Funding Statement: This work was supported by the National Natural Science Foundation of China (NSFC) (Grant No. 62172058) and the Hunan Provincial Natural Science Foundation of China (Grant Nos. 2022JJ10052, 2022JJ30624). Publisher Copyright: © 2023 Tech Science Press. All rights reserved.15551822engSDG 7 - Affordable and Clean EnergyBSNInternet of Thingsrandom isolation timereliability analysisTK Electrical engineering. Electronics Nuclear engineeringQA MathematicsBiomaterialsModelling and SimulationMechanics of MaterialsComputer Science ApplicationsElectrical and Electronic EngineeringTKQAJournal article10.32604/cmc.2023.037825http://www.scopus.com/inward/record.url?scp=85174397911&partnerID=8YFLogxK763