A fast simulation method for analysis of SEE in VLSI
Date
2021-05-01
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Citation
Lu, Y, Chen, X, Zhai, X, Saha, S, Ehsan, S, Su, J & McDonald-Maier, K 2021, 'A fast simulation method for analysis of SEE in VLSI', Microelectronics reliability, vol. 120, 114110. https://doi.org/10.1016/j.microrel.2021.114110