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A fast simulation method for analysis of SEE in VLSI

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dc.contributor.authorLu, Yufan
dc.contributor.authorChen, Xin
dc.contributor.authorZhai, Xiaojun
dc.contributor.authorSaha, Sangeet
dc.contributor.authorEhsan, Shoaib
dc.contributor.authorSu, Jinya
dc.contributor.authorMcDonald-Maier, Klaus
dc.contributor.institutionUniversity of Aberdeen.Computing Scienceen
dc.contributor.institutionUniversity of Aberdeen.Machine Learningen
dc.date.accessioned2022-04-25T11:36:01Z
dc.date.available2022-04-25T11:36:01Z
dc.date.issued2021-05-01
dc.descriptionThis work is supported by the UK Engineering and Physical Sciences Research Council through grants EP/R02572X/1 and EP/P017487/1.en
dc.description.statusPeer revieweden
dc.format.extent12
dc.format.extent3021834
dc.identifier215299673
dc.identifierfd972bc9-7ddb-491e-8567-31c3c54187af
dc.identifier000663147500007
dc.identifier85103379782
dc.identifier.citationLu, Y, Chen, X, Zhai, X, Saha, S, Ehsan, S, Su, J & McDonald-Maier, K 2021, 'A fast simulation method for analysis of SEE in VLSI', Microelectronics reliability, vol. 120, 114110. https://doi.org/10.1016/j.microrel.2021.114110en
dc.identifier.doi10.1016/j.microrel.2021.114110
dc.identifier.issn0026-2714
dc.identifier.otherORCID: /0000-0002-3121-7208/work/112496145
dc.identifier.urihttps://hdl.handle.net/2164/18477
dc.identifier.vol120en
dc.language.isoeng
dc.relation.ispartofMicroelectronics reliabilityen
dc.subjectSingle event effecten
dc.subjectFault injectionen
dc.subjectSEE modelsen
dc.subjectSEE mitigationen
dc.subjectHDL simulationen
dc.subjectVLSIen
dc.subjectEVENTen
dc.subjectPROPAGATIONen
dc.subjectQA75 Electronic computers. Computer scienceen
dc.subjectEngineering and Physical Sciences Research Council (EPSRC)en
dc.subjectEP/R02572X/1en
dc.subjectEP/P017487/1en
dc.subject.lccQA75en
dc.titleA fast simulation method for analysis of SEE in VLSIen
dc.typeJournal articleen

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