High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control
Date
2022-07-01
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Citation
Li, L, Fleming, A J, Yong, Y K, Aphale, S S & Zhu, L 2022, 'High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control', Mechanical Systems and Signal Processing, vol. 173, 109027. https://doi.org/10.1016/j.ymssp.2022.109027