High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control
| dc.contributor.author | Li, Linlin | |
| dc.contributor.author | Fleming, Andrew J. | |
| dc.contributor.author | Yong, Yuen Kuan | |
| dc.contributor.author | Aphale, Sumeet S. | |
| dc.contributor.author | Zhu, LiMin | |
| dc.contributor.institution | University of Aberdeen.Engineering | en |
| dc.contributor.institution | University of Aberdeen.Centre for Applied Dynamics Research (CADR) | en |
| dc.date.accessioned | 2023-03-07T00:27:46Z | |
| dc.date.available | 2023-03-07T00:27:46Z | |
| dc.date.embargoedUntil | 2023-03-07 | |
| dc.date.issued | 2022-07-01 | |
| dc.description | Acknowledgments This work was partially supported by the National Natural Science Foundation of China under Grant Nos. 52105581, U2013211, and 51975375, the China Postdoctoral Science Foundation (No. 2021M692065), and the Open Foundation of the State Key Laboratory of Fluid Power and Mechatronic Systems, China under Grant No. GZKF-202003, and the CDSC Scholarship, University of Newcastle, Australia, awarded to Linlin Li. | en |
| dc.description.status | Peer reviewed | en |
| dc.format.extent | 12 | |
| dc.format.extent | 17766070 | |
| dc.identifier | 214421204 | |
| dc.identifier | ad103f05-058f-4648-a943-768ccdbdc3d5 | |
| dc.identifier | 85127303622 | |
| dc.identifier.citation | Li, L, Fleming, A J, Yong, Y K, Aphale, S S & Zhu, L 2022, 'High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control', Mechanical Systems and Signal Processing, vol. 173, 109027. https://doi.org/10.1016/j.ymssp.2022.109027 | en |
| dc.identifier.doi | 10.1016/j.ymssp.2022.109027 | |
| dc.identifier.issn | 0888-3270 | |
| dc.identifier.other | ORCID: /0000-0002-1691-1648/work/115134579 | |
| dc.identifier.uri | https://hdl.handle.net/2164/20225 | |
| dc.identifier.vol | 173 | en |
| dc.language.iso | eng | |
| dc.relation.ispartof | Mechanical Systems and Signal Processing | en |
| dc.subject | atomic force microscopy | en |
| dc.subject | raster scanning | en |
| dc.subject | tracking control | en |
| dc.subject | repetitive control | en |
| dc.subject | cross-coupling | en |
| dc.subject | TA Engineering (General). Civil engineering (General) | en |
| dc.subject.lcc | TA | en |
| dc.title | High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control | en |
| dc.type | Journal article | en |
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